深圳大时代电子有限公司
| 数据表 | 图片 | 型号 | 制造商 | 描述 | 查看 |
|---|---|---|---|---|---|
 |
 |
SN74SSTU32864GKER | Texas Instruments | IC 25BIT CONFIG REG BUFF 96LFBGA | 咨询 |
|
|
74SSTVF32852ZKFR | Texas Instruments | IC RGSTRD BUFF 24-48BIT 114BGA | 咨询 |
|
|
74SSTUB32865ZJBR | Texas Instruments | IC REGISTERED BUFFER 160-TFBGA | 咨询 |
|
|
CSSTV32867SGKEREP | Texas Instruments | IC REGISTERED BUFF 26BIT 96LFBGA | 咨询 |
|
|
SN74ABT18504PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 咨询 |
|
|
SN74LVTH18646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 咨询 |
|
|
SN74SSTU32864ZKER | Texas Instruments | IC 25BIT CONFIG REG BUFF 96-BGA | 咨询 |
|
|
SN74LVTH182652APM | Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 咨询 |
|
|
74SSTUB32865AZJBR | Texas Instruments | IC REGSTR BUFF 28-56BIT 160NFBGA | 咨询 |
|
|
8V182512IDGGREP | Texas Instruments | IC ABT SCAN TEST DEV3.3V 64TSSOP | 咨询 |
|
|
SN74ABTH18646APM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 咨询 |
|
|
SN74ABT18652PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 咨询 |
|
|
SN74ABTH18652APM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 咨询 |
|
|
SN74LVT8996PW | Texas Instruments | IC 10-BIT SCAN PORT XCVR 24TSSOP | 咨询 |
|
|
SN74ABT18646PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 咨询 |
|
|
SN74ABTH182646APM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 咨询 |
|
|
CD74HCT283E | Texas Instruments | IC BIN FULL 4BIT ADD W/CAR 16DIP | 咨询 |
|
|
SN74LVTH18652APM | Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 咨询 |
|
|
CD74HCT283M | Texas Instruments | IC BIN FULL 4BIT ADD CAR 16SOIC | 咨询 |
|
|
SN74TVC3010PW | Texas Instruments | IC 10BIT VOLTAGE CLAMP 24-TSSOP | 咨询 |