深圳大时代电子有限公司
| 数据表 | 图片 | 型号 | 制造商 | 描述 | 查看 |
|---|---|---|---|---|---|
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SN74ABT8543DWRE4 | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 咨询 |
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SN74ABT18504PMRG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 咨询 |
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SN74ABT8646DWRE4 | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 咨询 |
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SN74ABT18640DLRG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | 咨询 |
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SN74ABT8652DLR | Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 咨询 |
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SN74LS283DR | Texas Instruments | IC BIN FULL 4BIT ADD CAR 16-SOIC | 咨询 |
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SN74ABT8652DWRE4 | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 咨询 |
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SN74ABT8952DLR | Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | 咨询 |
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SN74LS31DRE4 | Texas Instruments | IC HEX DELAY ELEMENT 16-SOIC | 咨询 |
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SN74ABT8652DLRG4 | Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 咨询 |
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SN74ACT1284PWE4 | Texas Instruments | IC 7BIT BUS INTERFC 3ST 20-TSSOP | 咨询 |
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SN74LS31DR | Texas Instruments | IC HEX DELAY ELEMENT 16-SOIC | 咨询 |
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SN74ABTH16460DLR | Texas Instruments | IC REGISTERED TRANSCVR 56SSOP | 咨询 |
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SN74ABT8652DWR | Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 咨询 |
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SN74ABT8952DLRG4 | Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | 咨询 |
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SN74LS283DRE4 | Texas Instruments | IC BIN FULL 4BIT ADD CAR 16-SOIC | 咨询 |
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SN74SSTV16857DGVRG | Texas Instruments | IC REG BUFF 14BIT SSTL 48-TVSOP | 咨询 |
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SN74S1050DR | Texas Instruments | IC 12-BIT BUS TERM ARRAY16-SOIC | 咨询 |
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SN74ACT1284PW | Texas Instruments | IC 7BIT BUS INTERFC 3ST 20-TSSOP | 咨询 |
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SN74S1050DRE4 | Texas Instruments | IC 12-BIT BUS TERM ARRAY16-SOIC | 咨询 |