深圳大时代电子有限公司
| 数据表 | 图片 | 型号 | 制造商 | 描述 | 查看 |
|---|---|---|---|---|---|
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SN74BCT8240ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 咨询 |
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SN74BCT8244ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 咨询 |
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SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 咨询 |
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SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 咨询 |
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SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 咨询 |
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SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 咨询 |
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SN74BCT8373ANT | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 咨询 |
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SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 咨询 |
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SN74F283NSR | Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | 咨询 |
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SN74BCT8240ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 咨询 |
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SN74F283DR | Texas Instruments | IC FULL ADDER 4BIT BIN 16-SOIC | 咨询 |
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SN74BCT8245ANT | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 咨询 |
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SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 咨询 |
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SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 咨询 |
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SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 咨询 |
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SN74F283NSRE4 | Texas Instruments | IC FULL ADDER 4BIT BIN 16SO | 咨询 |
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SN74BCT8244ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 咨询 |
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SN74BCT8374ANTG4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 咨询 |
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SN74FB2033ARCG3 | Texas Instruments | IC REGISTERED TXRX 8BIT 52QFP | 咨询 |
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SN74ABT8952DWR | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 咨询 |